20th International Conference on Spectral Line Shapes

20th International Conference on Spectral Line Shapes St. John's, Newfoundland, Canada, 6-11 June 2010 - AIP Conference Proceedings

2010

Paperback (16 Dec 2010)

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Publisher's Synopsis

This biennial conference is focused on the formation of spectral line profiles and with their use for diagnostic purposes. The line profiles are employed as powerful diagnostic tools for various media, such as neutral gases, technological gas discharges, magnetically confined plasmas for fusion, laser- and z-pinch-produced plasmas, astrophysical plasmas, planetary atmospheres.

Book information

ISBN: 9780735408456
Publisher: American Institute of Physics
Imprint: American Institute of Physics
Pub date:
Edition: 2010
Language: English
Number of pages: 303
Weight: 617g
Height: 239mm
Width: 168mm
Spine width: 23mm