Characterization of Epitaxial Semiconductor Films

Characterization of Epitaxial Semiconductor Films - Methods and Phenomena, Their Applications in Science and Technology

Book (01 Jan 1976)

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Book information

ISBN: 9780444414380
Publisher: Elsevier
Imprint: Elsevier
Pub date:
DEWEY: 537.622
DEWEY edition: 18
Language: English
Number of pages: 216
Weight: -1g
Height: 240mm
Width: 160mm