Electron-Beam Sources and Charged-Particle Optics

Electron-Beam Sources and Charged-Particle Optics 10-14 July 1995, San Diego, California - Proceedings / SPIE--the International Society for Optical Engineering

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Book information

ISBN: 9780819418814
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.38154
DEWEY edition: 21
Language: English
Number of pages: 536
Weight: -1g
Height: 280mm