Fundamentals of Atomic Force Microscopy

Fundamentals of Atomic Force Microscopy - Lessons from Nanoscience

Paperback (09 Oct 2015)

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Publisher's Synopsis

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to "Fundamentals of AFM", an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)

Book information

ISBN: 9789814630351
Publisher: World Scientific
Imprint: World Scientific Publishing
Pub date:
DEWEY: 502.82
DEWEY edition: 23
Language: English
Number of pages: 350
Weight: 492g
Height: 155mm
Width: 229mm
Spine width: 19mm