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Further Single Event Upset (Seu) Testing of Cmos Memories Using the Alice Accelerator, Ipn, Orsay

Further Single Event Upset (Seu) Testing of Cmos Memories Using the Alice Accelerator, Ipn, Orsay

Paperback (31 Dec 1987)

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Book information

ISBN: 9780705814959
Publisher: AEA Technology
Imprint: AEA Technology
Pub date:
Language: English
Number of pages: 10
Weight: -1g
Height: 300mm

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