Paperback
Not available for sale
Includes delivery to the United States
Out of stock
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale - Highlights the advanced research work from industry and academia in micro-nano devices test technology - Written at both introductory and advanced levels, provides the fundamentals and theories - Focuses on the measurement techniques for characterizing MEMS/NEMS devices
| ISBN: | 9781548115760 |
| Publisher: | Createspace Independent Publishing Platform |
| Imprint: | Createspace Independent Publishing Platform |
| Weight: | -1g |
$0.07off
Paperback
Published 15 Dec 2022
Save $0.07
$2.59off
Paperback
Published 25 Apr 2024
Save $2.59
$3.44off
Paperback
Published 01 Sep 1989
Save $3.44
$5.17off
Hardback
Published 11 Apr 2024
Save $5.17
