Book (01 Oct 1992)
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A clear description of the field of scanning electron microscopy and X-ray microanalysis, including coverage of specimen preparation, electron emission, lenses and electromagnetic fields, specimen-beam interactions, detectors, image construction, image processing, vacuum generation and energy and wavelength dispersive X-ray spectroscopy.
| ISBN: | 9780138137595 |
| Publisher: | Prentice Hall |
| Imprint: | Prentice Hall |
| Pub date: | 01 Oct 1992 |
| DEWEY: | 502.825 |
| DEWEY edition: | 20 |
| Number of pages: | 458 |
| Weight: | 861g |
| Height: | 247mm |
| Width: | 184mm |
| Spine width: | 25mm |
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