Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry

Hardback (30 Apr 1990)

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Publisher's Synopsis

These are the proceedings of the SIMS VII, which was the seventh in a series of conferences held biennially. It was dedicated to the memory of Donald E. Harrison, Jr and his pioneering research in the mechanisms of ion beam sputtering and in the use of molecular dynamics simulations for the study of ion bombardment of solids. Other than the Harrison memorial papers, speakers at the conference covered three other major areas. These were: organic and biological analyses; enhancement techniques; and the contribution of SIMS to the semiconductor industry.

Book information

ISBN: 9780471927389
Publisher: Wiley
Imprint: Wiley Blackwell
Pub date:
DEWEY: 543.0873
DEWEY edition: 20
Number of pages: 992
Weight: 1640g
Height: 61mm
Width: 35mm