X-Ray Diffraction at Elevated Temperatures

X-Ray Diffraction at Elevated Temperatures A Method for In Situ Process Analysis

Hardback (26 Feb 1993)

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Publisher's Synopsis

In light of the growing importance and availability of intense x-ray sources and position-sensitive detectors, this book offers comprehensive treatment of the principles, instrumentation, and applications of x-ray diffraction at elevated temperatures.

Book information

ISBN: 9780471187264
Publisher: John Wiley & Sons Inc
Imprint: Wiley Blackwell
Pub date:
Number of pages: 268
Weight: 567g
Height: 241mm
Width: 159mm
Spine width: 53mm