X-Ray Optics and Microanalysis

X-Ray Optics and Microanalysis Proceedings of the 20th International Congress, Karlsruhe, Germany, 15-18 September 2009 - AIP Conference Proceedings

2010

Hardback (12 May 2010)

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Publisher's Synopsis

ICXOM Series is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.

Book information

ISBN: 9780735407640
Publisher: American Institute of Physics
Imprint: American Institute of Physics
Pub date:
Edition: 2010
Language: English
Number of pages: 214
Weight: 726g
Height: 277mm
Width: 213mm
Spine width: 18mm